学術論文：2022

  1. “Simulation-Based Understanding of “Charge-Sharing Phenomenon” Induced by Heavy-Ion Incident on a 65 nm Bulk CMOS Memory Circuit”
    IEICE Trans. Electron. E105-C[1] (2021) 47–50. / DOI: 10.1587/transele.2021ECS6008
    Akifumi Maru, Akifumi Matsuda, Satoshi Kuboyama, and Mamoru Yoshimoto