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”Functional surface on periodical nanostructure self-organised by laser scanning with scanning speed of 300 m/min”
Satoru Kaneko, Takeshi Ito, Chihiro Kato, Satomi Tanaka, Yosuke Ono, Tokuo Yodo, Hiroyasu Nakata, Akira Matsuno, Takashi Nire, Akifumi Matsuda and Mamoru Yoshimoto
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”Growth of Nanocubic MgO on Silicon Substrate by Pulsed Laser Deposition”
Satoru Kaneko, Takeshi Ito, Masayasu Soga, Yu Motoizumi, Manabu Yasui, Yasuo Hirabayashi, Takeshi Ozawa and Mamoru Yoshimoto
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”Room-temperature synthesis of epitaxial oxide thin films for development of unequilibrium structure and novel electronic functionalization”
Mamoru YOSHIMOTO, Ryosuke YAMAUCHI, Daishi SHIOJIRI, Geng TAN, Satoru KANEKO and Akifumi MATSUDA
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“Contract Lattice Constant in Epitaxial MgO Thin Film from Point View of Ab initio calculation”
Proc. Int. Conf. on Research in Condensed Matter Physics (ICCMP2012) (2013) pp.4–7.
Satoru Kaneko, Mamoru Yoshimoto and Hirofumi Takikawa
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“Influence of P2O5/TeO2 composition ratio on the physical properties of V2O5-P2O5-TeO2 glasses for lead-free low-temperature sealing”
Takashi Naito, Akifumi Matsuda, Daishi Shiojiri, Takuya Aoyagi, Yuichi Sawai, Tadashi Fijieda, Shinichi Tachizono, Kei Yoshimura, Yuji Hashiba and Mamoru Yoshimoto
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“Investigations on electrical conduction properties and crystallization conditions of V2O5-P2O5 glass based semiconductors”
Akifumi Matsuda, Takuya Aoyagi, Takashi Naito, Tadashi Fujieda, Kenjiro Ikejiri, Koji Koyama, Ryosuke Yamauchi, Geng Tan, Satoru Kaneko and Mamoru Yoshimoto
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“Influence of Momentary Annealing on Surface Morphology of Room Temperature Pulsed Laser Deposited NiO(111) Epitaxial Thin Film grown on Atomically Stepped Sapphire (0001) Substrates”
Ryosuke Yamauchi, Geng Tan, Daishi Shiojiri, Koji Koyama, Satoru Kaneko, Akifumi Matsuda, and Mamoru Yoshimoto
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“Homoepitaxial growth of α-Al2O3 thin films on atomically stepped sapphire substrates by pulsed laser deposition at room-temperature”
Daishi Shiojiri, Ryosuke Yamauchi, Satoru Kaneko, Akifumi Matsuda, and Mamoru Yoshimoto
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“Influence of shield roughness on Mo/Si defect density for extreme ultraviolet lithography mask blanks”
Junichi Kageyama, Mamoru Yoshimoto, Akifumi Matsuda, Vibhu Jindal, Patrick Kearney, and Frank Goodwin